Light Elements
Low atomic number elements (C, O, N, Na, Mg) with poor detectability in standard portable XRF.
Elements below ~atomic number 11 are challenging for portable XRF because their fluorescent X-rays are low energy and easily absorbed.
Carbon in steel — critical for weldability and hardenability — requires OES, not portable XRF. Magnesium and aluminum in alloys are detectable with proper calibration and SDD detectors (Max/Ultra).
Related Terms
XRF (X-Ray Fluorescence)
Non-destructive elemental analysis using X-rays to excite atoms and measure emitted fluorescence.
OES (Optical Emission Spectrometry)
Spark-based lab technique excellent for C, S, P in steel — complements portable XRF.
LOD (Limit of Detection)
The lowest concentration an instrument can reliably distinguish from background noise.
SDD (Silicon Drift Detector)
High-resolution XRF detector enabling faster, more accurate multi-element analysis.